High frequency measurement/simulation

Measures dielectric constant, dielectric loss tangent, and interfacial conductivity up to the millimeter-wave frequency band.
・1GHz～10GHz : Cavity resonator
・10GHz～120GHz : Balanced type circular disc resonator

Measures transmission line S-parameters up to the millimeter-wave frequency band.
・Measurement using RF probe
・Measurement using RF connector
・High-precision positioning using a wafer prober
・Eye diagram measurement

We provide electromagnetic field analysis, thermal analysis, and stress analysis.
・SI analysis (reflection characteristics, transmission characteristics, eye diagram, TDR)
・PI analysis (IR drop, power supply impedance)
・Thermal analysis (thermal fluid, heat transfer)
・Stress analysis (via stress, strain)

Top Development and manufacturing of various mechatronics products High frequency measurement/simulation

Inquiries and free technical consultations

Dielectric properties measurement environment

Dielectric properties measurement sample

Measurements using a balanced type circular disk resonator use a disk-shaped sample.
It is also possible to manufacture samples.

Dielectric properties measurement examples

The balanced disk resonator measures from 10GHz～120GHz.
It is possible to understand the frequency dependence of the dielectric properties of each material.
・Relative dielectric constant
・Dielectric tangent
・Interface conductivity

Transmission characteristics: Measurement environment

Measures transmission line S-parameters up to the millimeter-wave frequency band.
・Measurement using RF probe
・Measurement using RF connector
・High-precision positioning using a wafer prober
・Eye diagram measurement

Transmission Characteristics: RF Probes and Contact Pads

Measurements using RF probes and RF connectors use dedicated pads.
Special pad designs are also available.

Transmission characteristics: 100GHz measurement example

The RF probe measures from 10MHz~110GHz.
It is possible to understand the transmission line characteristics of each material.
・Reflectivity
・Transmission characteristics
・Eye diagram
・TDR

Measurement example: Temperature measurement

The wafer prober measures temperatures ranging from 0°C~120°C.
・Reflectivity
・Transmission characteristics
・TDR

Measurement example: Back drill

We measure the effect of back-drilling via stubs on reducing transmission loss.

Measurement example: Substrate to motherboard route

Measures the transmission loss from the substrate to the system board.

Simulation Examples

A circuit simulation is performed using a three-dimensional electromagnetic field analysis model.
・S-parameter extraction
・Eye diagram analysis

Simulation example: Electromagnetic field analysis

Simulation example: Eye diagram

Simulation example: IR drop analysis and power supply impedance

IR drop analysis and power supply impedance analysis are performed.

Simulation example: Thermal analysis

We perform thermal fluid analysis and thermal design for semiconductor package mounting boards, heat sinks, housings, and fans.

Simulation example: Stress analysis

Conduct stress analysis of via structures.
・Any-layer board
・FCBGA substrate

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In addition to major corporate clients, we also serve universities, research institutes,
We also accept consultations from venture companies.
We also accept one-off orders from design companies and parts trading companies,
Please feel free to contact us for technical advice.

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